As the era of microscale technologies becomes increasingly overcome by that of the nanoscale, an ever-increasing emphasis on the accurate modelling of such scaled systems is apparent. This work explores the combination of the finite element method with a new set of statistical algorithms to model the optical properties of disordered nanoscale morphologies. A silicon surface textured with a random distribution of nanowires is created to simulate, as an example study, how it responds to incident light. By averaging over many iterations of the model in which the structural parameters are varied around average values, a good match to experiment is achieved, showcasing an error as low as 1.34% in magnitude against measured data. This research introduces a fresh computational approach to simulating heterogeneous material structures widely applicable for modelling across the field of nanotechnology.

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